3 article(s) from Majzik, Zsolt
Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
- Mykola Telychko,
- Jan Berger,
- Zsolt Majzik,
- Pavel Jelínek and
- Martin Švec
Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93
![[Graphic 1]](/bjnano/content/inline/2190-4286-6-93-i1.png?max-width=637&scale=1.18182)
× 6Characterization of the mechanical properties of qPlus sensors
- Jan Berger,
- Martin Švec,
- Martin Müller,
- Martin Ledinský,
- Antonín Fejfar,
- Pavel Jelínek and
- Zsolt Majzik
Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1
Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique
- Zsolt Majzik,
- Martin Setvín,
- Andreas Bettac,
- Albrecht Feltz,
- Vladimír Cháb and
- Pavel Jelínek
Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28
![[Graphic 7]](/bjnano/content/inline/2190-4286-3-28-i11.png?max-width=637&scale=1.18182)
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